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Table 4 Number of failure calculated by the accumulated plastic strain in each cycle for three different laminates

From: Computational study for reliability improvement of a circuit board

 

Lam. I

Lam. II

Lam. III

 

trace

via

trace

via

trace

via

ă€ˆ p ε〉 in %

0.409

0.282

0.318

0.236

0.262

0.204

N f.

8 760

16 279

13 325

21 903

18 402

27 924